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First test of cold edgeless silicon microstrip detectors

✍ Scribed by V. Avati; V. Boccone; K. Borer; M. Bozzo; R. Capra; L. Casagrande; K. Eggert; E. Heijne; S. Klauke; Z. Li; T. Mäki; A. Morelli; F. Oljemark; V. G. Palmieri; B. Perea-Solano; S. Tapprogge

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 274 KB
Volume: 518
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2003.10.078

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