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First principle study of neutral and charged self-defects in amorphous SiO2

✍ Scribed by Nicolas Richard; Layla Martin-Samos; Guido Roma; Yves Limoge; Jean-Paul Crocombette


Book ID
116668589
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
161 KB
Volume
351
Category
Article
ISSN
0022-3093

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