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Finite element analysis of the effects of pixel geometry on the electrical properties in semiconductor pixel detectors

✍ Scribed by Park, Ha Ryung; Youn, Hanbean; Han, Jong Chul; Kam, Soo Hwa; Kim, Ho Kyung


Book ID
120583297
Publisher
The Korean Physical Society
Year
2013
Tongue
English
Weight
482 KB
Volume
62
Category
Article
ISSN
0374-4884

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In this study, we examine how charge loss due to charge sharing in photon-counting pixels detectors affects the recording of spot intensity in an X-ray diffraction (XRD) setup. In the photon-counting configuration, the charge from photons that are absorbed at the boarder of a pixel will be shared be