Finite element analysis of resistivity measurement with four point probe in a diamond anvil cell

✍ Scribed by X. Huang; C. Gao; M. Li; C. He; A. Hao; D. Zhang; C. Yu; Y. Wang; C. Sang; X. Cui; G. Zou

• Book ID: 121789218
• Publisher: American Institute of Physics
• Year: 2007
• Tongue: English
• Weight: 302 KB
• Volume: 101
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.2712173