✦ LIBER ✦

Fine-structure in theI–U characteristics of CuSiO thin-film sandwich devices

✍ Scribed by Li, J. ;Beynon, J.

Publisher: John Wiley and Sons
Year: 1990
Tongue: English
Weight: 506 KB
Volume: 121
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211210119

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Waveform Analysis of the Dynamici−u Char

Waveform Analysis of the Dynamici−u Characteristics of CuSiOx Thin Film Sandwich Structures

✍ Li, J. ;Beynon, J. 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 304 KB

Study of diffusion barrier properties of

Study of diffusion barrier properties of ternary alloy (TixAlyNz) in Cu/TixAlyNz/SiO2/Si thin film structure

✍ Y.K. Lee; Khin Maung Latt; Thomas Osipowicz; Cham Sher-Yi 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 149 KB

Theoretical investigation of the static

Theoretical investigation of the static characteristics of coplanar thin film devices with a discontinuous change in conductivity at a critical temperature

✍ Anklam, H.-J. ;Röpke, U. 📂 Article 📅 1973 🏛 John Wiley and Sons 🌐 English ⚖ 152 KB

X-Ray Emission Spectroscopy of Cu(In,Ga)

X-Ray Emission Spectroscopy of Cu(In,Ga)(S,Se)2-Based Thin Film Solar Cells: Electronic Structure, Surface Oxidation, and Buried Interfaces

✍ Heske, C. ;Groh, U. ;Fuchs, O. ;Umbach, E. ;Franco, N. ;Bostedt, C. ;Terminello, 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 167 KB 👁 2 views