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Film thickness and composition determination for binary alloys using backscattered electrons

✍ Scribed by D.J. Wilson; A.E. Curzon

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 496 KB
Volume: 165
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(88)90692-x

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