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Field ion and scanning tunnel microscopy studies of surface and bulk defects in carbon and silicon

✍ Scribed by A. L. Suvorov; Yu. N. Cheblukov; N. E. Lazarev; A. F. Bobkov; M. O. Popov; V. P. Babaev


Book ID
110121492
Publisher
Springer
Year
2000
Tongue
English
Weight
939 KB
Volume
45
Category
Article
ISSN
1063-7842

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