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Field-induced degradation of organic field-effect transistors under vacuum condition

✍ Scribed by Hoonsang Yoon, Hyuk-kee Sung, Hyungtak Kim

Book ID: 120798548
Publisher: The Korean Physical Society
Year: 2013
Tongue: English
Weight: 371 KB
Volume: 62
Category: Article
ISSN: 0374-4884
DOI: 10.3938/jkps.62.536

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