Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

✍ Scribed by Nicolas Brodusch,Hendrix Demers,Raynald Gauvin (auth.)

• Publisher: Springer Singapore
• Year: 2018
• Tongue: English
• Leaves: 143
• Series: SpringerBriefs in Applied Sciences and Technology
• Edition: 1
• Category: Library

✦ Synopsis

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

✦ Table of Contents

Front Matter ....Pages i-xii
Introduction (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 1-4
Developments in Field Emission Gun Technologies and Advanced Detection Systems (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 5-12
Electron Detection Strategies for High Resolution Imaging: Deceleration and Energy Filtration (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 13-35
Low Voltage SEM (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 37-46
Low Voltage STEM in the SEM (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 47-53
The f-Ratio Method for X-Ray Microanalysis in the SEM (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 55-65
X-Ray Imaging with a Silicon Drift Detector Energy Dispersive Spectrometer (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 67-84
Electron Diffraction Techniques in the SEM (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 85-105
Magnetic Domain Imaging (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 107-113
Advanced Specimen Preparation (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 115-128
Conclusion and Perspectives (Nicolas Brodusch, Hendrix Demers, Raynald Gauvin)....Pages 129-131
Back Matter ....Pages 133-137

✦ Subjects

Characterization and Evaluation of Materials