Electron Microscopy: A Versatile Tool for Material Characterization

✍ Scribed by Debashis Mukherji

• Publisher: Bookboon Learning
• Year: 2017
• Tongue: English
• Leaves: 202
• Category: Library

✦ Synopsis

This book looks at electron microscopy in a comprehensive way covering different types of microscope (SEM, TEM, etc.) and operating mode (HREM, CBED, HAADF, EELS, etc.). It is not a textbook but a student companion. In addition to explaining the subject, it selects important terminology and explain further, keeping in mind the level comprehensible by graduate/under-graduate students. The complex mathematics behind electron microscopy is avoided but explained in a simplified way. The students are referred to original ideas and related sources. They are advised to look at textbooks to broaden knowledge.

✦ Table of Contents

Acknowledgements
Foreword
1 Introduction
References
2 Historical Timelines
3 Electron Beam Interaction with Materials
3.1 Electron Scattering
3.2 Electron Diffraction
3.3 X-ray Generation
3.4 References
4 Instrumentation
4.1 Electron Sources
4.2 Electron Optics
4.3 Electron and X-ray Detectors
4.4 References
5 Microscope Types and Operating Modes
5.1 Transmission Electron Microscope
5.2 Scanning Electron Microscope
5.3 Operating Modes in TEM and SEM
5.4 References
6 Microscopy and Analysis
6.1 Imaging
6.2 Diffraction
6.3 Analysis
6.4 References
Endnotes
About the author
About the reviewer: Prof. Dr. Gerhard Schumacher
About the reviewer: Dr Partha Ghosal
Review by DR PARTHA GHOSAL