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Ferromagnetic semiconductor superlattices studied by polarized neutron reflectometry

✍ Scribed by H. Kępa; C.F. Majkrzak; A. Yu. Sipatov; T.M. Giebultowicz


Book ID
103886927
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
439 KB
Volume
397
Category
Article
ISSN
0921-4526

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Polarized neutron reflectometry is used to study changes in the magnetic state of the layered heterostructure Pd(2 nm)/V(36.5 nm)/17[Fe(1 ML)/V(1 ML)]/10[Fe(4.7 nm)/V(4.7 nm)/MgO at 1.6, 3, 7 and 293 K. The temperature evolution of magnetic depth profiles is investigated. Below the superconducting t