Study on Microstructural Characterizatio
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Du, J. ;Wu, J. ;Tong, L. N. ;Lu, M. ;Du, J. H. ;Pan, M. H. ;Zhai, H. R. ;Xia, H.
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Article
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1998
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John Wiley and Sons
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English
โ 291 KB
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The structure and magnetic properties of a series of rf sputtered [Co(15 A ร )/V(d V )] 20 (5 A ร d V 40 A ร ) multilayers have been studied. The multilayer structure is found by X-ray diffraction, cross-section transmission electron microscopy (TEM), and high-resolution TEM (HRTEM) to be polycrysta