Study on Microstructural Characterization and Ferromagnetic Resonance in Sputtered Co/V Multilayers
✍ Scribed by Du, J. ;Wu, J. ;Tong, L. N. ;Lu, M. ;Du, J. H. ;Pan, M. H. ;Zhai, H. R. ;Xia, H.
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 291 KB
- Volume
- 167
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
The structure and magnetic properties of a series of rf sputtered [Co(15 A Ê )/V(d V )] 20 (5 A Ê d V 40 A Ê ) multilayers have been studied. The multilayer structure is found by X-ray diffraction, cross-section transmission electron microscopy (TEM), and high-resolution TEM (HRTEM) to be polycrystalline with small individual column grains and has fairly strong f.c.c. Co(111) and b.c.c. V(110) texture in the film growth direction. The structural characterizations also show composition-modulated structures and severely alloyed effect. Ferromagnetic resonance (FMR) measurements show relatively small g-factors (1.98 g 2.06) and 4pM eff values (about 0.9 T), which also indicate that the multilayers are severely alloyed. Complicated spin wave resonance (SWR) spectra were observed and analyzed. The evaluated small interlayer coupling constants, A g = 0.33 Â 10 ± ±7 J/cm 2 and A eff = 1.19 Â 10 ± ±14 J/cm, show the effect of weak exchange coupling between Co layers across V spacers.