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Ferromagnetic resonance linewidth in thin films coupled to NiO

✍ Scribed by McMichael, R. D.; Stiles, M. D.; Chen, P. J.; Egelhoff, W. F.

Book ID: 120228993
Publisher: American Institute of Physics
Year: 1998
Tongue: English
Weight: 372 KB
Volume: 83
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.367725

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