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Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods

✍ Scribed by Kalarickal, Sangita S.; Krivosik, Pavol; Wu, Mingzhong; Patton, Carl E.; Schneider, Michael L.; Kabos, Pavel; Silva, T. J.; Nibarger, John P.

Book ID: 111921087
Publisher: American Institute of Physics
Year: 2006
Tongue: English
Weight: 551 KB
Volume: 99
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.2197087

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