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Temperature Dependences of the Resistivity and the Ferromagnetic Resonance Linewidth in Permalloy Thin Films

✍ Scribed by Counil, G.; Devolder, T.; Kim, J.-V.; Crozat, P.; Chappert, C.; Zoll, S.; Fournel, R.


Book ID
114651459
Publisher
IEEE
Year
2006
Tongue
English
Weight
227 KB
Volume
42
Category
Article
ISSN
0018-9464

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