Ferroelectric and piezoelectric properti
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A.Z. Simões; C.S. Riccardi; A. Ries; M.A. Ramirez; E. Longo; J.A. Varela
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Article
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2008
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Elsevier Science
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English
⚖ 567 KB
The effect of film orientation on piezoelectric and ferroelectric properties of bismuth layered compounds deposited on platinum coated silicon substrates was investigated. Piezo-force microscopy was used to probe the local piezoelectric properties of Bi 4 Ti 3 O 12 , CaBi 4 Ti 4 O 15 and SrBi 4 Ti 4