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Fe-related defect centers in Si resulting from CW laser annealing

✍ Scribed by N.H. Sheng; J.L. Merz

Publisher: Elsevier Science
Year: 1983
Weight: 278 KB
Volume: 116
Category: Article
ISSN: 0378-4363
DOI: 10.1016/0378-4363(83)90306-6

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