Fe-implanted SiC as a potential DMS: X-ray diffraction and rutherford backscattering and channelling study

✍ Scribed by C. Dupeyrat; A. Declémy; M. Drouet; A. Debelle; L. Thomé

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 475 KB
• Volume: 268
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2010.03.018