✦ LIBER ✦

FDTD analysis of high frequency electronic interconnection effects

✍ Scribed by Cherry, P.C.; Iskander, M.F.

Book ID: 114552538
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 725 KB
Volume: 43
Category: Article
ISSN: 0018-9480
DOI: 10.1109/22.466178

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Hierarchical analysis of high frequency

Hierarchical analysis of high frequency interconnect networks

✍ Starzyk, J.A. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 623 KB

Frequency-Domain Analysis of Effects of

Frequency-Domain Analysis of Effects of a Diverged Interconnect Design Involved in High-Speed Front-End Electronics

✍ Hansang Lim 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 675 KB

Transient Analysis of CMOS-Gate-Driven I

Transient Analysis of CMOS-Gate-Driven Interconnects Based on FDTD

✍ Xiao-Chun Li; Jun-Fa Mao; Swaminathan, M. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 823 KB

Characteristic analysis of coupled HTS i

Characteristic analysis of coupled HTS interconnects with two-dimensional FDTD

✍ Jun-Fa Mao; Xiaoning Qian; Zhengyu Yuan 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 50 KB

Frequency-dependent parameter calculatio

Frequency-dependent parameter calculation of the on-chip interconnection lines by the FDTD method

✍ Zheng-Yu Yuan; Zheng-Fan Li 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 150 KB 👁 3 views

The frequency-dependent equi¨alent-circuit parameters of the on-chip interconnect structure are first obtained by the time-domain ( ) results from the finite-difference time-domain FDTD procedure. Many technologies are adopted in the time-domain analysis, and the results agree well with a¨ailable da

FDTD analysis of Talbot effect of a high

FDTD analysis of Talbot effect of a high density grating

✍ Yunqing Lu; Changhe Zhou; Hongxin Luo 📂 Article 📅 2005 🏛 Optics InfoBase 🌐 English ⚖ 309 KB