Transient Analysis of CMOS-Gate-Driven Interconnects Based on FDTD

✍ Scribed by Xiao-Chun Li; Jun-Fa Mao; Swaminathan, M.

• Book ID: 117908534
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 823 KB
• Volume: 30
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2010.2095650