Faults and fault effects in NMOS circuits¿impact on design for testability

✍ Scribed by Burgess, N.; Damper, R.I.; Shaw, S.J.; Wilkins, D.R.J.

• Book ID: 114452276
• Publisher: The Institution of Electrical Engineers
• Year: 1985
• Weight: 944 KB
• Volume: 132
• Category: Article
• ISSN: 0143-7089
• DOI: 10.1049/ip-g-1:19850019