<p><P>Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication t
Fault-Tolerance Techniques for SRAM-Based FPGAs (Frontiers in Electronic Testing)
β Scribed by Fernanda Lima Kastensmidt, Ricardo Reis
- Publisher
- Springer
- Year
- 2006
- Tongue
- English
- Leaves
- 192
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications.
β¦ Table of Contents
front-matter_1278......Page 1
1introduction_5549......Page 14
2radiation_effects_in_integrated_circuits_8606......Page 22
3single_event_upset__seu__mitigation_techniques_2078......Page 41
4architectural_seu_mitigation_techniques_5681......Page 84
5high-level_seu_mitigation_techniques_9586......Page 94
6triple_modular_redundancy__tmr__robustness_7031......Page 102
7designing_and_testing_a_tmr_micro-controller_1545......Page 122
8reducing_tmr_overheads_part_i_4590......Page 133
9reducing_tmr_overheads_part_ii_1662......Page 152
10final_remarks_1648......Page 180
back-matter_1286......Page 184
π SIMILAR VOLUMES
Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technol
This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques and tools are authored by key scientists in the field of system dependability and fault tolerance.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies of
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. ExaminesΒ the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits an
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test β OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-or