𝔖 Bobbio Scriptorium
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Fault tolerance and self-checking techniques in microprocessor-based system design

✍ Scribed by Lala, P.K.

Book ID
114462921
Publisher
Institution of Electrical Engineers
Year
1985
Weight
652 KB
Volume
4
Category
Article
ISSN
0261-3182

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## Abstract Advanced redundancy configurations are presented for static RAM modules. These extend the word duplication and selection by horizontal parity checking (WDSH) and error correction by horizontal and vertical parity checking (ECHV) configurations to enhance yields of wafer‐scale integrated