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Fast noiseproof set for testing metal-film resistors

โœ Scribed by V. V. Brusilovskii; Ya. M. Berfis


Publisher
Springer US
Year
1980
Tongue
English
Weight
151 KB
Volume
23
Category
Article
ISSN
0543-1972

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We propose and analyze a notched free-standing thin-film structure subject to a well-defined stress concentration in pure tension for in situ mechanical testing of thin metal films. Load is applied electrostatically, making testing and handling routine and simple. The sensitivity of the notched stru