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Fast atom/ion bombardment (FAB)

โœ Scribed by Fred W. McLafferty


Book ID
107920558
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
107 KB
Volume
122
Category
Article
ISSN
0168-1176

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Application of fast atom bombardment (FA
โœ H. Seyama; M. Soma ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 895 KB

## Abstract A CAMECA IMS4f ion microscope was modified to accommodate a fast atom bombardment (FAB) source and used for the analysis of the thin section of a rock sample (granodiorite). In contrast to conventional SIMS using a primary ion beam, it is easy to obtain secondary ion images and mass spe