Application of fast atom bombardment (FAB) for ion microscopy of a rock sample
β Scribed by H. Seyama; M. Soma
- Book ID
- 104592457
- Publisher
- John Wiley and Sons
- Year
- 1990
- Tongue
- English
- Weight
- 895 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0142-2421
No coin nor oath required. For personal study only.
β¦ Synopsis
Abstract
A CAMECA IMS4f ion microscope was modified to accommodate a fast atom bombardment (FAB) source and used for the analysis of the thin section of a rock sample (granodiorite). In contrast to conventional SIMS using a primary ion beam, it is easy to obtain secondary ion images and mass spectra of poorly conducting material, such as geological samples, by SIMS using a FAB source where the charging effect is easily avoided with the aid of a copper grid placed on the sample surface. The difference of elemental distribution between biotite and feldspar phases in the granodiorite sample was revealed in the positive secondary ion images and mass spectra obtained by use of an O~2~ FAB source. The images of ^23^Na^+^ and ^39^K^+^ ions clearly showed that the separation of potassium and sodium feldspars occurred in the process of feldspar crystallization.
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## Abstract Significant information on the structure of various bisazolium salts of the type CA~2~ (C^++^ 2A^β^) were revealed by the study of the FAB spectra of their positive and negative ions. Thus only one spectrum, whatever it consists of the positive or of the negative ions spectrum, enables