Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures

✍ Scribed by Mathias Schubert; Tino Hofmann; Craig M. Herzinger

• Book ID: 113936676
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 234 KB
• Volume: 455-456
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2003.11.215