✦ LIBER ✦
Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs
✍ Scribed by Schubert, Mathias; Hofmann, Tino; Herzinger, Craig M.
- Book ID
- 115389675
- Publisher
- Optical Society of America
- Year
- 2003
- Tongue
- English
- Weight
- 252 KB
- Volume
- 20
- Category
- Article
- ISSN
- 1084-7529
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