Failures induced by electromigration in ECL 100k devices: C. Canall, F. Fantini, E. Zanoi, A. Grovannetti and P. Brambilla Microelectron. Reliab. 24, (1), 77 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 88 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(85)80037-9

✦ Synopsis

glassy matrix of thick film resistors was etched away step by step and the noise was measured vs. the number of etching steps.

Switch failure in a two-unit standby system with better utilization of traits. L.R. GOEL findPRAVEEN GUPITA Aficroelectron. Reliab. 24,439 (1984) This paper analyses a two-unit cold standby system with three models and a switching device to put the offline unit into operation. The cold standby starts operating only after it becomes active. When turned on, the transfer switch (TS) operates successfully with fixed probabilityp( = -q), A single service facility is available to (i) repair a partially or totally failed unit, (if) repair the failed TS and (iii) activate the cold standby unit. The failure rates are constant, the activation and the repair rates are general.