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Failures induced by electromigration in ECL 100 k devices : C. Canali, F. Fantini, E. Zanoni, A. Giovannetti and P. Brambilla. Microelectron. Reliab.24, 77 (1984)

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 226 KB
Volume: 25
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(85)90032-0

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