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Failure mechanisms of IGBTs under short-circuit and clamped inductive switching stress

✍ Scribed by Trivedi, M.; Shenai, K.

Book ID: 120654040
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 181 KB
Volume: 14
Category: Article
ISSN: 0885-8993
DOI: 10.1109/63.737598

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