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A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation

✍ Scribed by A. Benmansour; S. Azzopardi; J.C. Martin; E. Woirgard


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
326 KB
Volume
47
Category
Article
ISSN
0026-2714

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