Failure mechanisms in silicon transistors deduced from step stress tests

✍ Scribed by M.R.P. Young; O.M. Elkins

• Book ID: 113190398
• Publisher: Elsevier Science
• Year: 1966
• Tongue: English
• Weight: 765 KB
• Volume: 5
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(66)90156-9