✦ LIBER ✦
Absence of defect state creation in nanocrystalline silicon thin film transistors deduced from constant current stress measurements
✍ Scribed by Esmaeili-Rad, Mohammad R.; Sazonov, Andrei; Nathan, Arokia
- Book ID
- 118742428
- Publisher
- American Institute of Physics
- Year
- 2007
- Tongue
- English
- Weight
- 567 KB
- Volume
- 91
- Category
- Article
- ISSN
- 0003-6951
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