Failure analysis of electronic devices and materials : Yoshiyu'ki Ihara and Susumu Shinoda. Proceedings of the 21st Symposium on Reliability and Maintainability, Japan, 125 (June 1991)

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 118 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90418-k