Discussion of failures and their causes in electronic devices (belong to MTTF system) : Hiroyuki Yoshida and Keiko Toi. Proceedings of the 21st Symposium on Reliability and Maintainability, Japan, 5 (June 1991)

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 126 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90311-8