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Failure analysis of cracked brass turrets used in electronic circuits

✍ Scribed by Ninan, Nirmal; Narayana Murty, S.V.S.; Manwatkar, Sushant; Ramesh Narayanan, P.

Book ID: 124130918
Publisher: Elsevier
Year: 2014
Tongue: English
Weight: 581 KB
Volume: 2
Category: Article
ISSN: 2213-2902
DOI: 10.1016/j.csefa.2014.04.004

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