✦ LIBER ✦
Efficient computer-aided failure analysis of integrated circuits using scanning electron microscopy : William V. Oxford and Roy H. Propst. IEEE Trans. Reliab.R-34(5), 410 (1985)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 129 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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