Factors influencing the accuracy of the quartz-crystal oscillator as a thickness monitor for thin film deposition: Pulker, H.K., Schödler, W., Il Nuovo Cimento, Vol LVII B, No 1, p 19–24

• Book ID: 107866048
• Publisher: Elsevier Science
• Year: 1969
• Tongue: English
• Weight: 183 KB
• Volume: 7
• Category: Article
• ISSN: 0041-624X
• DOI: 10.1016/0041-624x(69)90714-8