Factors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes

✍ Scribed by E. Simoen; C. Claeys; H. Ohyama; Y. Takami; H. Sunaga

• Book ID: 105540596
• Publisher: Springer
• Year: 1999
• Tongue: English
• Weight: 381 KB
• Volume: 239
• Category: Article
• ISSN: 1588-2780
• DOI: 10.1007/bf02349558