Factors determining the damage coefficients and the low-frequency noise in MeV proton-irradiated silicon diodes

✍ Scribed by Simoen, E.; Claeys, C.; Ohyama, H.

• Book ID: 114554885
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 325 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.659558