Cd 1-x Mn x Te (x=0.2, CdMnTe) crystal was grown by the vertical Bridgman method, which exhibits a pure zincblende structure in the whole ingot. The major defect, twins, which is fatal to CdMnTe crystal, was analyzed with scanning electron microscopy (SEM), X-ray energy disperse spectroscopy (XEDS)
Facet formation in silicon single crystals grown by VMFZ method
β Scribed by Kimura, M.; Arai, H.; Mori, T.; Yamagishi, H.
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 503 KB
- Volume
- 128
- Category
- Article
- ISSN
- 0022-0248
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