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The characterization of the (111) facet faces on the seed cone of [100] silicon single crystals grown by MCZ and CZ methods by X-ray CTR scattering

✍ Scribed by J. Harada; T. Shimura; M. Takata; K. Yakushiji; K. Hoshi


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
528 KB
Volume
104
Category
Article
ISSN
0022-0248

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