Fabrication and dynamic testing of electrostatic actuators with p+ silicon diaphragms
β Scribed by E.H. Yang; S.S. Yang; S.W. Han; S.Y. Kim
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 602 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0924-4247
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β¦ Synopsis
This paper presents the fabrication and testing of electrostatic actuators with (\mathrm{p}^{+})diaphragms. The actuators consist of two counter electrodes which are fabricated on a silicon wafer and Pyrex glass, respectively. The (\mathrm{p}^{+})diaphragm is used as a moving electrode, whereas the aluminium layer deposited on #7740 Pyrex glass is used as a fixed electrode. According to the calculation of static deflection of diaphragms with residual tensile stress, corrugated diaphragms deflect more than a flat one in most deflection regions. The dynamic characteristics of an actuator with a corrugated diaphragm and one with a flat diaphragm are tested and compared with the calculation results.
π SIMILAR VOLUMES
Pixel detectors for mammographic applications have been fabricated at ITC-irst on 800 mm thick silicon wafers adopting a double side n + -on-n fabrication technology. The activity aims at increasing the X-ray detection efficiency in the energy range of interest minimizing the risk of electrical disc