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Fabrication and characterization of p-Si/n-ZnO heterostructured junctions

โœ Scribed by P. Klason; M.M. Rahman; Q.-H. Hu; O. Nur; R. Turan; M. Willander

Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
920 KB
Volume
40
Category
Article
ISSN
0026-2692

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Fabrication and characterization of NiO/
Fabrication and characterization of NiO/ZnO pโ€“n junctions by pulsed laser deposition
โœ R.K. Gupta; K. Ghosh; P.K. Kahol ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 534 KB

Transparent and conducting ZnO and NiO films were used for fabrication of p-n junction by pulsed laser deposition. These films were characterized by X-ray diffraction (XRD), atomic force microscopy, UV-visible spectroscopy, and electrical techniques. XRD shows that ZnO films are highly orientated al