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Extrinsic Dissociation of a Dislocation in GaAs in the Presence of Point Defects

✍ Scribed by Theodore, N. D. ;De Cooman, B. C. ;Carter, C. B.


Book ID
105381373
Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
493 KB
Volume
114
Category
Article
ISSN
0031-8965

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We investigated the migration of a symmetric tilt, low-angle grain boundary (LAGB) under applied shear stress in the presence of extrinsic dislocations. The results demonstrate that there is a threshold stress for the LAGB to depin from extrinsic dislocations. Below the threshold stress, the LAGB re