Extreme Statistics in Nanoscale Memory D
β Amith Singhee (auth.), Amith Singhee, Rob A. Rutenbar (eds.)
π Library
π
2010
π Springer
π English
β¦ LIBER β¦
π
Extreme Statistics in Nanoscale Memory Design
β Scribed by Amith Singhee (auth.), Amith Singhee, Rob A. Rutenbar (eds.)
- Publisher
- Springer US
- Year
- 2010
- Tongue
- English
- Leaves
- 257
- Series
- Integrated Circuits and Systems
- Edition
- 1
- Category
- Library
β¬ Acquire This Volume
No coin nor oath required. For personal study only.
β¦ Synopsis
Extreme Statistics in Nanoscale Memory Design brings together some of the worldβs leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme statistics in nanoscale memories. The work covers a variety of techniques, including statistical, deterministic, model-based and non-parametric methods, along with relevant description of the sources of variations and their impact on devices and memory design. Specifically, the authors cover methods from extreme value theory, Monte Carlo simulation, reliability modeling, direct memory margin computation and hypervolume computation. Ideas are also presented both from the perspective of an EDA practitioner and a memory designer to provide a comprehensive understanding of the state-of -the-art in the area of extreme statistics estimation and statistical memory design. Extreme Statistics in Nanoscale Memory Design is a useful reference on statistical design of integrated circuits for researchers, engineers and professionals.
β¦ Table of Contents
Front Matter....Pages i-ix
Introduction....Pages 1-8
Extreme Statistics in Memories....Pages 9-15
Statistical Nano CMOS Variability and Its Impact on SRAM....Pages 17-49
Importance Sampling-Based Estimation: Applications to Memory Design....Pages 51-96
Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics....Pages 97-136
Yield Estimation by Computing Probabilistic Hypervolumes....Pages 137-177
Most Probable Point-Based Methods....Pages 179-202
Extreme Value Theory: Application to Memory Statistics....Pages 203-240
Back Matter....Pages 241-246
β¦ Subjects
Circuits and Systems; Electronics and Microelectronics, Instrumentation
π SIMILAR VOLUMES
Nanoscale Memory Repair
β Masashi Horiguchi, Kiyoo Itoh (auth.)
π Library
π
2011
π Springer-Verlag New York
π English
<p><p>Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern
PCB Design for External DDR Memory
β Qualcomm Technologies Inc.
π Library
π
2014
π Qualcomm Technologies Inc.
π English
Nanoscale Semiconductor Memories: Techno
β Santosh K. Kurinec, Krzysztof Iniewski
π Library
π
2013
π CRC Press
π English
<P>Nanoscale memories are used everywhere. From your iPhone to a supercomputer, every electronic device contains at least one such type. With coverage of current and prototypical technologies, <B>Nanoscale Semiconductor Memories: Technology and Applications</B> presents the latest research in the fi
Designing Network On-Chip Architectures
β Jose Flich, Davide Bertozzi
π Library
π
2011
π Chapman and Hall/CRC
π English
Paving the way for the use of network on-chip architectures in 2015 platforms, this book presents the industrial requirements for such long-term platforms as well as the main research findings for technology-aware architecture design. It covers homogeneous design techniques and guidelines, including
Designing Network On-Chip Architectures
β Jose Flich (Editor); Davide Bertozzi (Editor)
π Library
π
2010
π Chapman and Hall/CRC
<p>Going beyond isolated research ideas and design experiences, Designing Network On-Chip Architectures in the Nanoscale Era covers the foundations and design methods of network on-chip (NoC) technology. The contributors draw on their own lessons learned to provide strong practical guidance on vario