<p>Extreme Statistics in Nanoscale Memory Design brings together some of the worldβs leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme s
Extreme Statistics in Nanoscale Memory Design
β Scribed by Amith Singhee (auth.), Amith Singhee, Rob A. Rutenbar (eds.)
- Publisher
- Springer
- Year
- 2010
- Tongue
- English
- Leaves
- 246
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Subjects
Electronics and Microelectronics, Instrumentation
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