Extra diffractions caused by stacking faults in cubic crystals
β Scribed by H.Z. Xiao; A.C. Daykin
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 967 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0304-3991
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The critical voltages for systematic reflections and splits of Kikuchi lines were measured using a high-voltage electron microscope to investigate the atomic temperature factors in cubic crystals. The split of the Kikuchi line at the intersection with the forbidden 222 Kikuchi line as well as the cr
## Abstract To investigate the oneβdimensionally disordered structures (ODDS) in the close packed (cp) crystals, the Monte Carlo computer simulation technique has been applied. Calculations of the diffraction intensity distributions along the 10.L reciprocal lattice row from the 6H(33) structure wi